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A. I. Volkov, N. V. Alov
Influence of distance between
spectrometer and sample on X-ray fluorescence intensity
Abstract
The
expressions for the focal spot extreme points coordinates of X-ray tube and the
detector takeoff area used for the determination of analyzed sample zone were
found. The dependence of X-ray fluorescence intensity from the distance between
the spectrometer and sample was studied. The intensity of spectral line Fe-Ka in
iron-bearing materials at the different geometric conditions of spectrometer
was calculated. It was found that the distance between the spectrometer and
sample, at this the maximum of measured intensity is observed, is influenced on
the size and position of X-ray tube and detector collimators, the positional
relationship of X-ray tube and detector. The recommendations for the
achievement of maximal X-ray fluorescence intensity were done. The results
obtained could be used for the development of X-ray fluorescence analysis
techniques of loose materials directly in technological production line.
Copyright (C) Chemistry Dept., Moscow State University, 2002
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